Semiconductor Characterization System

The Keithley 4200-SCS Semiconductor Characterization System provides intuitive and sophisticated capabilities for semiconductor device characterization with 9 slot chassis and an integrated controller. By combining unprecedented measurement sensitivity and accuracy, the device ensures measurement accuracy of 0.015% +3 mV at 200 V and 0.012% +80 µV at 200 mV. The Keithley 4200-SCS Semiconductor Characterization System is equipped with an embedded Windows®-based operating system while featuring an integrated DVD/CD-RW drive, allowing high-capacity backup and data transfer. The Keithley 4200-SCS is modular, configurable, and upgradeable, offering four core measurement modules to be mixed and matched in the nine instrument slots and configured with up to seven additional SMUs. Features： Precision DC current-voltage (I-V) measurements are the foundation of a full characterization planAC impedance, including the well-known capacitance-voltage (C-V) technique, provides information beyond what DC alone can providePulsed and transient testing adds a time domain dimension and allows for dynamic characteristics to be exploredUp to nine precision, DC source-measure units can supply voltage or current and measure voltage or current from 0.1 fA to 1 A and from 1 μV to 210 VEasy AC impedance testing with the model 4210-CVU multi-frequency C-V module, at test frequencies from 1 kHz to 10 MHzPulse and transient measurements can be performed with the model 4225-PMU Ultra-Fast I-V moduleChoice of two different digital oscilloscope modules, making digitizing waveforms easy and efficient