oscilloscope

Core FeaturesModular Architecture: The TDS8200 is a modular sampling oscilloscope that accepts various plug-in modules (80E0x electrical modules, 80Cxx optical modules) for configuration flexibility.Ultra-Low Jitter Performance: When paired with the 82A04 Phase Reference Module, the system achieves jitter measurements of <200 fs RMS, making it ideal for high-speed serial data characterization. Time Interval Accuracy is <200 fs with the 82A04, and <800 fs without.High Bandwidth: Configurable with plug-in modules to provide bandwidths up to 70 GHz.Multi-Channel Capability: Supports up to eight input channels with four color-coded variable-persistence waveform databases.Differential TDR/TDT: Supports true differential TDR/TDT with up to four differential pairs for crosstalk and impedance measurements.FrameScan™ Acquisition Mode: Enables efficient acquisition and analysis of repetitive signals.Comprehensive Measurement System: Includes independently customizable measurements and all features of the CSA8200 Communications Signal Analyzer.Both Free-Run and Triggered Modes: Available with the same low-jitter performance.Clock Recovery: Single-ended and differential clock recovery covers serial data standards from 50 Mbits/s to 12.5 Gbits/s.ApplicationsResearch & Development: High-speed digital design and characterizationSemiconductor Test: Component characterization and validationHigh-Speed Serial Data Testing: Telecom and datacom applications from 2.0 to 12.5 Gbits/sTDR Impedance Measurements: PCB impedance flaw detection and differential signal path analysisManufacturing Test: Production testing of high-speed components and systems