Broadband oscilloscope host

The 86100D DCA-X is based on hardware performance and achieves precise control throughout the entire link from signal capture to data analysis. Its core indicators reach industry-leading levels:Ultra-wide bandwidth and multi-channel parallel capability: The host bandwidth can reach 90 GHz (some configurations support over 100 GHz), with 16 synchronous acquisition channels, capable of simultaneously capturing high-speed signals from multiple ports, meeting the testing requirements of high-density parallel designs. Ultra-low jitter and noise base: With an ultra-low jitter characteristic of 100 fs RMS and a noise level as low as 250 μV, it effectively avoids the measurement errors introduced by the testing equipment itself, ensuring the precise characterization of key parameters such as jitter and amplitude of high-speed signals. High-precision timing base and sampling performance: Equipped with an optional precise timing base (PTB), the minimum horizontal scale can reach 500 fs/div, and the time interval resolution can be as high as 62.5 fs; combined with a 14-bit A/D converter and a maximum recording length of 32M samples, it can delicately reproduce the waveform details of high-speed signals.Dual interface flexible switching: Standard equipped with a 10.4-inch XGA touch screen, supporting one-click switching between the new FlexDCA vectorized interface and the classic DCA-J interface, catering to both the customized operation needs of experienced engineers and the quick learning requirements of novice users. Automation and scalability: Built-in GPIB interface (GPI option), supporting remote control and integration of test automation; offers MATLAB software package option (061/062), enabling customized data analysis and script development, thereby enhancing test efficiency. Investment protection design: The host supports hardware module upgrades and software function expansions, and is backward compatible with previous models such as 86100C. This effectively extends the equipment's lifespan and reduces the cost of testing equipment iterations.