安捷伦Agilent 16034E芯片元件测试治具参数
Published on2026-05-12
安捷伦Agilent 16034E芯片元件测试治具是款专为SMD（表面贴装器件）阻抗评估设计的高精度测试夹具，适用于多种LCR表和阻抗分析仪，Agilent 16034E的参数及应用场景。Agilent 16034E参数频率范围：直流至 40 MHz（多数资料一致）有部分资料（如）提到最高支持120 MHz，但该说法未在其他权威来源中得到交叉验证，以 40MHz为准更可靠测量精度：±1.5 × (f/10)²%（f 为频率，单位 MHz）使用SMD最小尺寸：1.6 mm（长）× 0.8 mm（宽）直流偏振电压：±40V峰值（AC+DC合计）终端连接：BNC 接口 + 4 端子对（4-terminal pair）配置，确保高精度四线制测量物理尺寸：约128 mm（宽）× 60 mm（高）× 71 mm（深）重量约 270 g（0.59 lb）工作温度：0 °C 至 55 °C兼容测量仪器Agilent/Keysight LCR 表：4192A、4194A（阻抗模式）、4263B、4278A、4279A、4284A、4285A、4294A、E4980A等Agilent 16034E应用场景SMD元件阻抗分析：包括电阻、电容、电感等无源器件的高频特性评估小尺寸芯片测试：适用于0603及以上封装（1.6×0.8mm）的SMD器件研发与质检环节：用于生产线或实验室中对SMD元件进行快速、重复性高的阻抗测量配合LCR仪表使用：通过四端对连接消除引线效应，提升高频测量准确性
Key Words：Agilent 16034E16034E16034E芯片元件测试治具
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